Ib qho ntawm cov kev cov nyom ntawm 3D luam tawm tau cov ntsiab lus tau rov qab, xws li cov khoom siv zoo thiab qhov qub tib yam, siv cov lus qhia sib txawv. Ntau txoj kev tshawb fawb tau luam tawm ntau lub xyoo rau kev tsim kev qhia, thiab Patrick Hartunian thiab Mohsen Eshraghi, ob tug neeg tshawb fawb los ntawm California State University hauv Los Angeles, koom nrog lub pob.
Hartunian thiab Eshraghi tau siv cov kev kuaj ntawm cov ntaub ntawv nyuaj ntawm cov SLM 3D, nrog rau kev ua qauv zoo nkauj, qhov nyuaj, thiab kev sib tw ntawm qhov chaw roughness. Lawv kawm txog cov pob zeb tawg thiab cov microstructure ntawm cov qauv siv ob leeg kho qhov muag thiab kev xa khoom electron microscopy (SEM) cov tswv yim.
Cov kws tshawb fawb tau sau tseg tias ib qho ntawm cov duab ntawm SLM 3D luam tawm yog cov tiav roughness ntawm lub luam tawm nto, thiab cov qauv ntu qauv qhia tau hais tias cov ntaub ntawv roughness ntawm cov hniav txawv kuj sib txawv thiab. Txawm li cas los xij, thaum lub plhom sab ploughness tus nqi siab siab, qhov saum toj ntawm qhov hnoos qis tau zoo ib yam.
